Olympus MPlanFL N 5X Epi Objective | 0.15 NA, BD, Infinity Corrected 10445906 LEICA X Y ATTACHABLE POL

LEICA X Y ATTACHABLE POL STAGE ATTACHES TO THE LEICA CIRCULAR STAGES TO PROVIDE X Y MOVEMNET OF YOUR SAMPLE

this lens provides excellent resolution for detailed cellular imaging

and reduced risk of sample contact

offering the highest-in-class 12

🔬 Designed for Olympus MX61 & MX63 — semiconductor and FPD inspection microscopes

Olympus MPlanFL N 5X Epi Objective | 0.15 NA, BD, Infinity Corrected 10445906 LEICA X Y ATTACHABLE POLPremium 5 objective with brightfield and darkfield capability ideal for industrial inspection and materials science applications. 5 Magnification, NA 0. 15 Wide field of view with excellent depth of field for overview imaging and inspection. Brightfield Darkfield (BD) Capability Dual mode imaging for enhanced contrast and defect detection on reflective surfaces. Working Distance (12 mm) Generous clearance provides specimen safety and accommodates